High Resolution Imaging and X-Ray Microanalysis in the FE-SEM
نویسندگان
چکیده
منابع مشابه
High-resolution X-ray diffraction and imaging
This issue of Journal of Applied Crystallography includes some highlights of the 11th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), held in St Petersburg in 2012.
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2011
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927611003850